奈米與生物科技的探索者--人類眼睛的極限:ZEISS電子顯微鏡(TEM,SEM,FIB)——電子顯微鏡提供了人類眼睛無限的延伸，探索材料進入原子尺度的範圍，ZEISS提供了掃描式電子顯微鏡(SEM)，穿透式電子顯微鏡(TEM)，聚焦式離子顯微鏡(FIB)，帶領人們進入半導體、生物、醫學、材料、化學、物理、機械各領域一窺物質的奧，提供人類無限探索的可能。We　will make the furture better!!!
　

zeiss

LEO 1500XB CrossBeam® Workstation

　The ZEISS 1500XB Series CrossBeam® workstations combine the outstanding imaging capabilities of the GEMINI field emission column with a high performance focused ion beam. This makes the 1500XB CrossBeam® series the ultimate research tool for material analysis and semiconductor applications.
　The 1500XB CrossBeam® series offers a comprehensive and versatile gas injection system for ion beam deposition of metals or insulators and for enhanced etching.
　Two different models, together with a wide range of additional accessories and analytical capabilities, make the ZEISS 1500XB CrossBeam® workstation the perfect solution for TEM sample preparation, cross section investigation, three dimensional structural examination, failure analysis and MEMS.
WB01542_.gif (1088 bytes)System Features :
　•Ultra-high resolution for structural and material analysis and semiconductor applications
　•Versatile gas injection system for ion beam material deposition and selective / enhanced etching
　•CrossBeam® provides unique live SEM imaging during milling, polishing and deposition
　•Two infra-red CCD chamber cameras for safe specimen handling and navigation.
　•Additional accessory ports for EDS and SIMS detectors
　
台灣儀器行股份有限公司 　台北市南京東路三段272號4樓
TEL:(02)2772-3333　FAX:(02)2731-1700　客戶申訴專線 :(02)2711-6211

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