 Scanning Electron
Microscopes. New scanning modes, all-new objective lens, higher signal
detection, and image capture techniques provide the most informative
images. The class-leading X-ray analysis capabilities makes it the most
effective range of analytical SEMs currently available.
The new (XVP) extended Variable Pressure mode now exceeds the
limitations of all other VP and LV instruments, providing real leverage
against challenging imaging requirements. The EVO XVP offers the ability
to investigate non conducting specimens without intrusive preparation
and the possibility to introduce water vapour at sufficient pressures to
avoid dehydration damage.
The EVO 50EP and EVO 60EP models offer an Extended Pressure range up to
3000 Pa. This enables the imaging of dynamic process involving water in
life science, pharmaceutical and material analysis applications.
The Future Assured upgrade path from HV to XVP or even EP, the
outstanding range of accessories, the diversity of applications of the
ZEISS EVO ensures the perfect answer to every application requirement.
At LEO we are proud to provide you with the latest SEM technology. |
 Quality
features : |
•High resolution, enhanced
contrast, multi mode imaging capabilities
•Class leading X-ray analysis capabilities
•XVP mode with air or water up to 750Pa
•Enhanced VPSE detector for SE imaging in XVP mode
•Upgrade path from HV via XVP to EP (for EVO 50 and EVO 60)
•Intuitive operation with Windows® based LEO32 with multi-lingual task
orientated GUI
•Seamless integrated hardpanel for direct function access
•ICE - Intregrated Computer Environment |
| Learn
more about the EVO series |
•ZEISS EVO 40
Series：Comprehensive SVP/HV SEM
•ZEISS EVO 50 Series：Research Grade Analytical SEM
•ZEISS EVO 60 Series：Imaging solution for large specimensM |
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