In
nearly all fields of modern science and technology the demands on
scanning electron microscopy are becoming ever more challenging. ZEISS’s
answer to these nano science challenges is the unique GEMINI field
emission column, a sophisticated solution recognized by microscopists
worldwide as the leader.
ZEISS introduces the new SUPRA series based on the 3rd generation
improved GEMINI column. The new SUPRA series offers a complete range of
FESEMs models to cover all fileds of applications. ZEISS’s unique variable
pressure (VP) capability enables the user to examine a variety of
non-conducting samples without time consuming preparation.
The ZEISS SUPRA versatile analytical ultra high resolution FESEM concept
now extends imaging and analytical resolution beyond previously
achievable limits. |
 ZEISS's
SUPRA concept offers : |
•Superior resolution and
excellent contrast at high, low and ultra low voltage imaging
•Extended accelerating voltage range from 30kV down to 100V
•Separate and simultaneous detection of SE and BSE
•High efficiency In-lens detector for pure SE detection
•Unlimited analytical capabilities combined with ultra-high imaging
resolution
•High current mode for analytical applications combined with
unsurpassed long term stability; 20nA / 0.2%/h
•Simple point and click selection of high vacuum (HV) or variable
pressure (VP) mode
•Versatile column and specimen chamber design with a choice of fully
motorised specimen stages
•Easy operation through Windows 2002 based LEO32 SEM control |
| Learn
more about the SUPRA series FESEM's |
•ZEISS SUPRA 25：The
affordable FESEM with GEMINI column
•ZEISS SUPRA 35：General purpose high throughput FESEM
•ZEISS SUPRA 35VP：Ultra-high performance VP FESEM
•ZEISS SUPRA 50：High current analytical FESEM
•ZEISS SUPRA 50VP：Variable Pressureanalytical FESEM
•ZEISS SUPRA 55：Versatile ultra high resolution analytical FESEM
•ZEISS SUPRA 55VP：Analytical ultra-high resoltuion VP FESEM
•ZEISS SUPRA 60：GEMINI FESEM for large samples
•ZEISS SUPRA 60VP：Larger specimen variable pressure FESEM |
| The new ZEISS SUPRA combines
four instruments in one; ultra high resolution FESEM over the complete
voltage range, FESEM for handling large awkwardly shaped specimens, full
analytical FESEM with probe currents up to 30nA and ZEISS’s proprietary VP
(variable pressure) technology to investigate non conducting sample
without prior preparation. |
| Benefits |
•Superb image quality
•Fully analytical tool
•Variable pressure solutions
•Multiple applications
•Enhanced EBSD, CL and STEM capabilities
•ZEISS 32 optimised user interface
•Integrated Computer Environment |
| Technical
Benefits |
•Advanced Schottky Field
Emission Source
•GEMINI Innovative Electron Optical Column
•Ultra-high Performance Objective Lens
•High Efficiency SE Signal Detection
•Variable Pressure Technology
•ZEISS SUPRA series vacuum system
•VPSE - Variable Pressure SE Detector
•Variable Pressure Solution
•Principles of VP operation |
